首页> 外国专利> The monitor and the monitor transducer structure of multiple components.Process for measuring the composition of a mixture of multiple components and process for determining the relationship volumetricas of components of a mixture of multicomponents

The monitor and the monitor transducer structure of multiple components.Process for measuring the composition of a mixture of multiple components and process for determining the relationship volumetricas of components of a mixture of multicomponents

机译:监测器和监测器换能器结构的组成。测量多种组分的混合物的组成的过程和确定多种组分的混合物的关系体积的过程

摘要

Radio frequency bridge techniques are used to parameterize the complex dielectric properties of solids, liquids, gasses and mixtures thereof. This parameterization is performed in an electrically isolated, physically open structure which allows continuous or batch monitoring of the materials and their mixtures. A method and apparatus are provided for measuring the composition of mutlicomponent process streams flowing in pipes or ducts. The method uses the pipe in which the mixture flows as a waveguide in which propagating radio frequency electromagnetic energy is induced through dielectric loaded apertures. The dielectric measurement is performed in an electrically isolated, flow through test section which induces constructive or destructive interference patterns at characteristics frequencies. The characteristic frequency determines the dielectric constant of the mixture. The dielectric properties are used in turn to determine mixture composition. A density measurement is also provided for three comiponent strams such as oil, water, and gas. Temperature and pressure measurements are made to correct for temperature and pressure induced variations in calibrated component impedance and density values.
机译:射频桥技术用于参数化固体,液体,气体及其混合物的复杂介电性能。该参数化是在电隔离的,物理上开放的结构中执行的,该结构允许对物料及其混合物进行连续或批量监控。提供了一种用于测量在管道或管道中流动的多组分工艺流的组成的方法和设备。该方法使用混合物在其中流动的管道作为波导,通过介电加载孔在其中感应出传播的射频电磁能。介电测量在电隔离的流通测试部分中进行,该测试部分会在特征频率处引发相长或相消干涉图样。特征频率决定了混合物的介电常数。介电性能又用于确定混合物组成。还提供了三个配套层(例如油,水和天然气)的密度测量。进行温度和压力测量以校正温度和压力引起的校准组件阻抗和密度值的变化。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号