首页> 外国专利> Method of using selected photoactive compounds in high resolution, acid hardening photoresists with near ultraviolet radiation wherein the photoresist comprise conventional deep UV photoacid generators

Method of using selected photoactive compounds in high resolution, acid hardening photoresists with near ultraviolet radiation wherein the photoresist comprise conventional deep UV photoacid generators

机译:在近紫外辐射的高分辨率,酸硬化光致抗蚀剂中使用选定的光敏化合物的方法,其中光致抗蚀剂包括常规的深紫外线光致产酸剂

摘要

Photosensitive compositions, suitable for use as negative photoresist compositions with exposing systems that operate using near UV radiation, are provided. The photosensitive compositions comprise (i) photoactive material which is (a) photoacid generator and, as sensitizer, phenothiazine, a phenothiazine derivative, phenoxazine or a phenoxazine derivative or (b) 2-chlorophenothiazine, and (ii) acid-hardening resin system. The photosensitive compositions can be used to produce thermally stable, high resolution images with near UV exposing radiation.
机译:提供了适合用作负性光致抗蚀剂组合物的光敏组合物,所述负性光致抗蚀剂组合物具有使用近紫外线辐射进行操作的曝光系统。该光敏组合物包含(i)光活性材料,其为(a)光酸产生剂,以及作为敏化剂的吩噻嗪,吩噻嗪衍生物,吩恶嗪或吩恶嗪衍生物或(b)2-氯吩噻嗪,和(ii)酸硬化树脂体系。该光敏组合物可用于产生具有近紫外线曝光辐射的热稳定的高分辨率图像。

著录项

  • 公开/公告号NO902666L

    专利类型

  • 公开/公告日1990-12-21

    原文格式PDF

  • 申请/专利权人 ROHM AND HAAS COMPANY;

    申请/专利号NO19900002666

  • 发明设计人 FEELY WAYNE EDMUND;

    申请日1990-06-15

  • 分类号G03C1/73;G03F7/038;

  • 国家 NO

  • 入库时间 2022-08-22 05:58:00

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