Architecture and device for testable mixed analog and digital VLSI circuits

摘要

An architecture and device for testing mixed analog and digital VLSI circuits, wherein the digital circuit portions of the chip are grouped into a digital block, and the analog circuit portions of the chip are grouped into an analog block. Analog signals are pro­vided to the digital block through an A/D transducer, and digital signals are provided to the analog block through a D/A transducer. The analog and digital blocks may be isolated from each other by a digital input mul­tiplexer disposed between the A/D transducer and the digital block, and by an analog input multiplexer dis­posed between the D/A transducer and the analog block. To minimize the number of pins required to implement the architecture, multiplexers are connected to accessed circuit nodes in the analog block and the digital block for selectively communicating signals from the accessed nodes to external output pins.