首页> 外国专利> PROCESS FOR PLASMA DEPOSITING SILICON NITRIDE AND SILICON DIOXIDE FILMS ONTO A SUBSTRATE

PROCESS FOR PLASMA DEPOSITING SILICON NITRIDE AND SILICON DIOXIDE FILMS ONTO A SUBSTRATE

机译:等离子体沉积氮化硅和二氧化硅薄膜到基质上的过程

摘要

A deposition process chemical vapor plasma process for forming silicon nitride films and silicon dioxide on a substrate is characterized by the following steps: a) introducing di-tert-butylsilane and at least other reactant gas capable of reacting with di-tert-butylsilane to form either silicon nitride or silicon dioxide into a deposition reaction zone chemical vapor prrocédé containing said substrate on which is to be formed film silicon nitride or silicon dioxide film; b) maintaining the temperature of said zone and said substrate from about 100 ° C and 350 ° C; c) maintaining the pressure in said area between about 0.1 Torr and about 5 Torr; and d) passing said gas mixture into contact with said substrate while exciting said gas mixture with a plasma for a sufficiently long time to form a silicon nitride film or silicon dioxide on said substrate, said plasma being excited by RF energy between 10 and 500 Watts.
机译:用于在衬底上形成氮化硅膜和二氧化硅的沉积工艺化学气相等离子体工艺的特征在于以下步骤:a)引入二叔丁基硅烷和至少其他能够与二叔丁基硅烷反应形成的反应气体氮化硅或二氧化硅进入沉积反应区化学汽相混合物中,该反应区含有要在其上形成氮化硅或二氧化硅膜的衬底; b)保持所述区域和所述衬底的温度在大约100℃和350℃之间; c)将所述区域的压力保持在约0.1托至约5托之间; d)使所述气体混合物与所述衬底接触,同时用等离子体激发所述气体混合物足够长的时间以在所述衬底上形成氮化硅膜或二氧化硅,所述等离子体被10至500瓦之间的RF能量激发。

著录项

  • 公开/公告号EP0417170A1

    专利类型

  • 公开/公告日1991-03-20

    原文格式PDF

  • 申请/专利权人 OLIN CORPORATION;

    申请/专利号EP19890906620

  • 发明设计人 DORY THOMAS S.;

    申请日1989-05-22

  • 分类号C23C16/42;C23C16/34;C23C16/40;C23C16/50;C23C16/52;

  • 国家 EP

  • 入库时间 2022-08-22 05:53:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号