首页> 外国专利> PROCESS FOR PLASMA DEPOSITING SILICON NITRIDE AND SILICON DIOXIDE FILMS ONTO A SUBSTRATE

PROCESS FOR PLASMA DEPOSITING SILICON NITRIDE AND SILICON DIOXIDE FILMS ONTO A SUBSTRATE

机译:等离子体沉积氮化硅和二氧化硅薄膜到基质上的过程

摘要

A plasma CVD process for forming silicon nitride-type or silicon dioxide-type films onto a substrate comprising the steps of: (a) introducing di-tert-butylsilane and at least one other reactant gas into a CVD reaction zone containing said substrate on which either a silicon nitride-type or silicon dioxide-type film is to be formed; (b) maintaining the temperature of said zone and said substrate from about 100 DEG C. to about 350 DEG C.; (c) maintaining the pressure in said zone from about 0.1 to about 5 Torr; and (d) passing said gas mixture into contact with said substrate while exciting said gas mixture with a plasma for a period of time sufficient to form a silicon nitride-type or silicon dioxide-type film on said substrate, wherein said plasma is excited by a RF power at about 10 to 500 Watts.
机译:在衬底上形成氮化硅型或二氧化硅型膜的等离子体CVD工艺,包括以下步骤:(a)将二叔丁基硅烷和至少一种其他反应气体引入包含所述衬底的CVD反应区中形成氮化硅型或二氧化硅型膜。 (b)使所述区域和所述衬底的温度保持在约100℃至约350℃; (c)将所述区域的压力维持在约0.1至约5托。 (d)使所述气体混合物与所述衬底接触,同时用等离子体激发所述气体混合物一段足以在所述衬底上形成氮化硅型或二氧化硅型膜的时间,其中,通过大约10至500瓦的RF功率。

著录项

  • 公开/公告号EP0417170B1

    专利类型

  • 公开/公告日1993-01-07

    原文格式PDF

  • 申请/专利权人 OLIN CORPORATION;

    申请/专利号EP19890906620

  • 发明设计人 DORY THOMAS S.;

    申请日1989-05-22

  • 分类号B05B3/02;B05B3/06;C23C16/34;C23C16/40;

  • 国家 EP

  • 入库时间 2022-08-22 05:06:18

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