首页>
外国专利>
METHOD OF CALIBRATING WAVELENGTH SCALE OF SPECTROPHOTOMETERS
METHOD OF CALIBRATING WAVELENGTH SCALE OF SPECTROPHOTOMETERS
展开▼
机译:分光光度计波长刻度的校正方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to the field of optics and can be used u0434u043bu00a0 u0433u0440u0430u0434u0443u0438u0440u043eu0432u043au0438 scale wavelengths of optical devices, in particular the absorbtion spectrophotometre. to improve the accuracy of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 u00a0u0432u043bu00a0u0435u0442u0441u00a0 u0433u0440u0430u0434u0443u0438u0440u043eu0432u043au0438 and ensuring u0438u0441u043fu043eu043bu044cu0437u043eu0432u0430u043du0438u00a0 one standard for all types u0434u043bu00a0 u0433u0440u0430u0434u0443u0438u0440u043eu0432u043au0438 absorbtion spectrophotometre half x in the ultraviolet, visible, near and middle infrared - u043eu0431u043bu0430u0441u0442u00a0u0445.in u0433u0440u0430u0434u0443u0438u0440u043eu0432u043au0435 scale wavelengths as a benchmark u0438u0441u043fu043eu043bu044cu0437u0443u0435u0442u0441u00a0 single crystal nd, Gaj - 0, t spectra u043fu043eu0433u043bu043eu0449u0435u043du0438u00a0 ions nd in u0433u0440u0430u043du0430u0442u043eu0432u043eu0439 matrix are narrow u0438u043du0442u0435u0438u0441u0438u0432u043du044cu0442u0435 lee research institute of u043fu043eu0433u043bu043eu0449u0435u043du0438u00a0 in a wide range of wavelengths from 0.25 to 8 microns. paragraph (l c
展开▼