METHOD FOR MEASURING ELECTRET SURFACE CHARGE DENSITY

摘要

the invention u043eu0442u043du043eu0441u0438u0442u0441u00a0 to measurement technique and can be used u0434u043bu00a0 u0438u0437u043cu0435u0440u0435u043du0438u00a0 surface density u0437u0430u0440u00a0u0434u0430 plates u044du043bu0435u043au0442u0440u0435u0442u0430. the purpose of u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0 - extension of the u043fu0440u0438u043cu0435u043du0435u043du0438u00a0 str - u0441u043eu0431u043b u044du043bu0435u043au0442u0440u0435u0442u0430 samples with an unknown thickness and dielectric porous.the plate u044du043bu0435u043au0442u0440u0435u0442u0430 have on the stationary plate dynamic condenser, u043fu043eu0434u0432u0438u0436u043du0430u00a0 plate which performs the harmonic u043au043eu043bu0435u0431u0430u043du0438u00a0 in aims so, u043fu0435u0440u043fu0435u043du0434u0438u043au0443u043bu00a0u0440u043du043eu043c to surface u044du043bu0435u043au0442u0440u0435u0442u0430 and u0438u0437u043cu0435u0440u00a0u044eu0442 amplitude current (max in the external circuit and the time interval between the adjacent points at the size u043du0438u00a0 shock and u043cu043fu043bu0438u0442u0443u0434u043du043eu0433u043e u0437u043du0430u0447u0435u043du0438u00a0,after which the surface density of u0440u0430u0437u0440u00a0u0434u0430 u044du043bu0435u043au0442u0440u0435u0442u0430 u043eu043fu0440u0435u0434u0435u043bu00a0u044eu0442 formula shown in the description. u0431u043bu0430u0433u043eu0434u0430u0440u00a0 measured at measurement of samples may have u044du043fu0435u043au0442u0440u0435u0442u0430 with unknown u0437u043du0430u0447u0435u043du0438u00a0u043cu0438 thickness and dielectric permeability. 1 il.