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Superconductivity critical temp. measuring system - useful for high temp. superconductor thin films

机译:超导临界温度测量系统-适用于高温。超导薄膜

摘要

System for measuring the critical temp of superconductive thin films has (i) an emitter coil (4) associated with a receiver coil (6) exposed to the hf magnetic field (B) of the emitter coil, the superconductive thin film (2) between the two coils and at least approximately perpendicular to the magnetic field (B); (ii) an hf generator (5) connected to the emitter coil (4); and (iii) a measuring unit (7) for the voltage induced in the receiver coil (6). USE/ADVANTAGE - Measuring system is useful for high Tc superconductive oxide thin films, eg used as wiring levels in ICs with high electron mobility transistors as inactive elements. It allows low cost, non-destructive determn of critical temps.
机译:用于测量超导薄膜的临界温度的系统具有(i)与接收器线圈(6)相关的发射器线圈(4),接收器线圈(6)暴露于发射器线圈的hf磁场(B),超导薄膜(2)两个线圈并且至少近似垂直于磁场(B); (ii)连接到发射线圈(4)的高频发生器(5); (iii)测量单元(7),用于在接收线圈(6)中感应的电压。使用/优点-测量系统可用于高Tc超导氧化物薄膜,例如,用作具有高电子迁移率晶体管作为惰性元件的IC的布线水平。它允许低成本,非破坏性地确定临界温度。

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