Measuring arrangement for optical absorption in thin film material - uses laser source, optical doubler and double position sensor

摘要

An arrangement for measuring optical absorption in thin film material using photothermal deflection spectroscopy contains a combination of a laser source (100), an optical doubler (103, 108) between the source and the specimen, and a double position sensor (106). - The optical doubler consists of a beam splitter (103) which divides the input beam into two mutually perpendicular partial beams of identical intensity and a prism (108) with total internal reflection placed behind the divider in the beam direction.