Executing and evaluating electron microscopic examinations - ascertaining relative position of crystal coordinate system(s) w.r.t. electron microscopic relevant coordinate system

摘要

The method is based on the combined application of K-lines (Kikuck, Coates, electron back-scatter lines etc) imaging and other electron microscopic imaging or signals and used directly during work at the microscope and pref. controlled by a computer. At least two easily identifiable K line poles are automatically or manually set sequentially for each crystal to be investigated directly before the actual electron microscopic examinations by means of crystal rotation with goniometer for accurate placing on the centrum or consistently on the same spot of the screen of the microscope. USE - Scientific investigation of material by means of crystalline samples for transmission, raster-transmission or raster electron microscopes.