A method for increasing the production or manufacturing yield of a product by the application of mathematical modeling techniques on the statistical distributions of major components of the product to maximize the production yield thereof. The product is assembled from a plurality of components, each of which is produced in multiple different manufacturing lots. Initially, the statistical characteristics of significant performance specifications of each major component used in the assembly of the product are established for each manufacturing lot of that component. The statistically probable performance of the product assembled with different combinations of components from different manufacturing lots is evaluated to assess the performance sensitivity of the assembled product to different combinations of the components from different manufacturing lots. As a consequence thereof, the best statistical combinations of different components from different manufacturing lots are selected to achieve the highest probable yield of assembled products with acceptable performance characteristics. The present invention is particularly applicable to the assembly of an electronic product assembled from a plurality of electronic components.
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