Plasma ion source mass spectrometer for trace elements

摘要

A plasma ion source mass spectrometer for trace elements is provided with a plasma generating section, an ion beam generating section, an ion beam focusing section, an ion mass analyzer section and an ion detector section, is further provided with a resonance charge exchange reaction section and an ion energy analyzer section, both sections being disposed between the ion beam focusing section and the ion mass analyzer section and being constructed such that fast disturbing ions contained in the incident ion beam are transformed in the resonance charge exchange reaction section into fast neutral atoms (or molecules) and slow disturbing ion, and such that the fast neutral atoms (or molecules) and the slow disturbing ions described aboved are separated to be removed from the ions to be analyzed.