首页> 外国专利> ANTIREFLECTION FILM FOR SILICON SUBSTRATE OR GERMANIUM SUBSTRATE

ANTIREFLECTION FILM FOR SILICON SUBSTRATE OR GERMANIUM SUBSTRATE

机译:硅基质或锗基质的抗反射膜

摘要

PURPOSE:To improve an antireflection characteristic and durability by consisting the above film of multilayered films contg. silicon dioxide as a layer in contact with a substrate. CONSTITUTION:A 1st layer, 2nd layer ... N-th layer are formed from an air side and the N-th layer is formed in contact with the silicon substrate or germanium substrate. The 1st layer is formed of a fluoride, the 2nd layer of a zinc sulfide(ZnS) layer and the 3rd layer of a germanium(Ge) layer; thereafter, the ZnS layers and the Ge layers are alternately formed. The (N-1)st layer consists of the Ge layer and the N-th layer of the silicon dioxide (SiO2) film. Then, the materials (fluoride, Ge) having tensile stress and the materials having compressive stress (ZnS) are alternately laminated and, therefore, the mutual stresses are relieved and since these layers have the excellent adhesiveness to each other, the films hardly crack. The antireflection films to be formed on the silicon or germanium substrate are most preferably made into 4-layered constitution.
机译:用途:通过将上述多层膜续涂,以提高抗反射特性和耐久性。二氧化硅作为与基材接触的层。组成:第一层,第二层……第N层从空气侧形成,第N层形成为与硅基板或锗基板接触。第一层由氟化物,第二层由硫化锌(ZnS)层和第三层由锗(Ge)层形成;之后,交替形成ZnS层和Ge层。第(N-1)层由二氧化硅(SiO 2)膜的Ge层和第N层组成。然后,交替地层叠具有拉伸应力的材料(氟化物,Ge)和具有压缩应力的材料(ZnS),因此,消除了相互应力,并且由于这些层彼此之间具有优异的粘附性,因此膜几乎不破裂。最优选将要形成在硅或锗基板上的防反射膜制成4层结构。

著录项

  • 公开/公告号JPH04221901A

    专利类型

  • 公开/公告日1992-08-12

    原文格式PDF

  • 申请/专利权人 MINOLTA CAMERA CO LTD;

    申请/专利号JP19900405699

  • 发明设计人 FUKUMOTO MARIKO;HATANO TAKUJI;

    申请日1990-12-25

  • 分类号G02B1/11;G02B1/113;

  • 国家 JP

  • 入库时间 2022-08-22 05:45:35

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