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TWO WAVE MOTION INTERFEROMETER

机译:两波运动干涉仪

摘要

PURPOSE: To improve measurement precision by shifting one wave orthogonally to the other wave and analyzing the shift state of an output beam before the waves are combined. CONSTITUTION: A beam splitter 2 spits an incoming beam, which is polarized horizontally linearly into a reference beam 3 and a measurement beam 4. The beams 3 and 4 are returned by mirrors 5 and 6 to the splitter 2 and recombined into a beam 7. In this case, the beam 3 before being returned to the splitter 2 is converted by a 1/4-wavelength plate 10 into orthogonal polarized light. Then the polarization state of the recombined beam 7 is analyzed by a polarized light analyzing device 11. Consequently, the phase shift between the two light beams due to a difference in the optical path is measured to improve the measurement precision.
机译:目的:通过将一个波正交于另一个波并在合并波之前分析输出光束的移动状态来提高测量精度。组成:分束器2发射入射光束,该光束被水平线性偏振为参考光束3和测量光束4。光束3和4被反射镜5和6返回到分束器2并重新组合为光束7。在这种情况下,在返回到分束器2之前的光束3被1/4波长板10转换为正交偏振光。然后,通过偏振光分析装置11分析重组光束7的偏振状态。因此,测量由于光程不同而引起的两个光束之间的相移,以提高测量精度。

著录项

  • 公开/公告号JPH04289401A

    专利类型

  • 公开/公告日1992-10-14

    原文格式PDF

  • 申请/专利权人 FRANCE ETAT;

    申请/专利号JP19900341177

  • 发明设计人 EME BAREIYU;

    申请日1990-11-30

  • 分类号G01B9/02;G01J9/00;

  • 国家 JP

  • 入库时间 2022-08-22 05:44:51

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