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LOAD SHORTCIRCUIT DETECTION CIRCUIT OF IGBT AND PROTECTING CIRCUIT USING IT

机译:IGBT的负载短路检测电路及使用该电路的保护电路

摘要

PURPOSE:To detect load shortcircuit without using high voltage signal and to acquire a load detection circuit without false detection by providing an IGBT a driver of a gate thereof and a bipolar transistor for detecting electric potential between electric potential of a gate path of the IGBT and electric potential of a driving power supply path of the driver. CONSTITUTION:When an input IN2 is 'on' level, an IGBT element Q2 is 'on' and normal load current flows to load R. In the state, when input IN1 is 'on' level and IGBT element Q1 is 'on', shortcircuit occures in the IGBT element Q2 and collector electric potential of the Q2 rises. Owing to the electric potential rise, gate electric potential of the Q2 rises through gate-to-collector capacity CGC, a bipolar transistor Q4 is 'on', a flip-flop 55 is set, and Q3 is in 'on' state. Load shortcircuit is detected by 'on' of the transistor Q4. Gate electric potential of the IGBT element Q2 is restrained from approximately +VGG to 'R2.VGG/ R1+R2+R4' by 'on' of the transistor Q3. Since a collector-to-emitter current thereby decreases, an allowable shortcircuit time of Q2 is increased.
机译:用途:通过不使用高压信号来检测负载短路,并通过提供IGBT的栅极驱动器和双极晶体管来检测负载短路电路,该IGBT的栅极驱动器和双极晶体管用于检测IGBT的栅极路径的电势与驾驶员的驱动电源路径的电位。组成:当输入IN2为“ on”电平时,IGBT元件Q2为“ on”,正常负载电流流向负载R。在这种状态下,当输入IN1为“ on”电平且IGBT元件Q1为“ on”时, IGBT元件Q2发生短路,Q2的集电极电位上升。由于电位的升高,Q2的栅极电位通过栅极-集电极电容CGC升高,双极晶体管Q4处于“导通”状态,触发器55被置位,并且Q3处于“导通”状态。负载短路通过晶体管Q4的“导通”来检测。通过晶体管Q3的“导通”将IGBT元件Q2的栅极电势从大约+ VGG限制到“ R2.VGG / R1 + R2 + R4”。因此,由于集电极-发射极之间的电流减小,因此允许的Q2短路时间增加。

著录项

  • 公开/公告号JPH0448656A

    专利类型

  • 公开/公告日1992-02-18

    原文格式PDF

  • 申请/专利权人 TOSHIBA CORP;

    申请/专利号JP19900155773

  • 发明设计人 SASADA YORIMICHI;

    申请日1990-06-14

  • 分类号H01L29/78;H01L29/739;

  • 国家 JP

  • 入库时间 2022-08-22 05:41:50

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