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EMISSION SPECTRAL ANALYSIS AND DEVICE THEREFOR

机译:发射光谱分析及其装置

摘要

PURPOSE:To obtain the emission spectral analysis method and device there for which can analyze the constituents having each low concentration with high precision and high reproducibility. CONSTITUTION:An emission spectral analysis device is equipped with a fluid flow passage 5 for the flow of the fluid for cooling or heating a sample 3, gas introducing passage 6 for introducing the gas flown onto the sample 3, and a temperature measuring device 9 for measuring the temperature of the sample 3. The sample 3 held on a holding body 1 is cooled or heated, and after the rise of the temperature to a necessary temperature is confirmed by a temperature measuring device 9, electric discharge is carried out between the sample 3 and a counter electrode 7, and the spectral analysis for the light obtained through electric discharge is carried out.
机译:目的:获得一种发射光谱分析方法和装置,可以对每种低浓度的成分进行高精度,高重现性的分析。组成:发射光谱分析设备配备有用于冷却或加热样品3的流体流动的流体流动通道5,用于将流到样品3上的气体引入的气体引入通道6和用于测量样品3的气体的温度测量装置9。测量样品3的温度。冷却或加热保持在保持体1上的样品3,并且在温度测量装置9确认温度升高到所需温度之后,在样品之间进行放电。参照图3和对电极7,对通过放电获得的光进行光谱分析。

著录项

  • 公开/公告号JPH04309848A

    专利类型

  • 公开/公告日1992-11-02

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL IND LTD;

    申请/专利号JP19910103839

  • 发明设计人 ISHII KAZUYA;MATSUMOTO YOSHIRO;

    申请日1991-04-08

  • 分类号G01N21/67;

  • 国家 JP

  • 入库时间 2022-08-22 05:41:30

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