首页> 外国专利> METHOD FOR CONTROLLING PLATING FILM THICKNESS OF ELECTROLESS-PLATED MAGNETIC DISK MEDIUM

METHOD FOR CONTROLLING PLATING FILM THICKNESS OF ELECTROLESS-PLATED MAGNETIC DISK MEDIUM

机译:控制无电镀磁介质镀膜厚度的方法

摘要

PURPOSE:To suppress the variations in plating precipitation amt. by applying a negative bias on a material to be electroless-plated to determine the percipitation starting point and the plating precipitation amt. CONSTITUTION:An Al disk substrate 1 coated with an Ni-P film 2 is dipped in an electroless Ni-P plating soln., a negative bias is applied for a specified time to determine the precipitation starting point, and the thickness of the Ni-P plating film 3 is controlled to a specified value. The substrate is then dipped in an electroless Co-Ni-P plating soln., and a Co-Ni-P plating magnetic film 4 is formed by the same control as before. As a result, the coefficient of variation of the plating film thickness is reduced, and the yield is increased.
机译:目的:抑制电镀沉淀物的变化。通过在要化学镀的材料上施加负偏压来确定沉淀的起始点和镀层的沉淀量。组成:将涂有Ni-P膜2的Al圆盘基板1浸入化学镀Ni-P溶液中,在规定的时间内施加负偏压以确定沉淀的起点,以及Ni-的厚度将P镀膜3控制为规定值。然后将衬底浸入化学镀的Co-Ni-P电镀溶液中,并通过与之前相同的控制形成Co-Ni-P电镀磁性膜4。结果,减小了镀膜厚度的变化系数,并且提高了成品率。

著录项

  • 公开/公告号JPH04254915A

    专利类型

  • 公开/公告日1992-09-10

    原文格式PDF

  • 申请/专利权人 NEC IBARAKI LTD;

    申请/专利号JP19910035312

  • 发明设计人 AUCHI TADASHI;

    申请日1991-02-05

  • 分类号G11B5/858;

  • 国家 JP

  • 入库时间 2022-08-22 05:41:00

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