SAMPLE SETTING PEDESTAL AND FLUORESCENT X-RAY ANALYZING METHOD USING THE PEDESTAL

摘要

PURPOSE:To conveniently and rapidly perform analysis by including an element which emits fluorescent X-rays having a wavelength that is shorter in the vicinity of an absorption end of an element to be analyzed contained in a sample, then that at the absorption end. CONSTITUTION:When a primary X-rays 3 are made to irradiate a sample 2 set on a pedestal 1, first fluorescent X-rays 4 are emitted from the sample 2. Further, the X-rays 3 transmits through the sample 2 and into the pedestal 1, and accordingly, second fluorescent X-rays 5 are emitted also from the pedestal 1. Further, X-rays 5, 6 as analyzing rays are led into spectrometric crystal which diffract the X-rays that are then introduced into a detecting pipe. Since the pedestal 1 contains therein an element, as a main component, located in the vicinity of an absorption end of an element to be analyzed in the sample 2 and emitting fluorescent X-rays having a wavelength shorter than that at the absorption end, not only the X-rays 4 but also the X-rays 6 are emitted from the surface of the sample 2. Accordingly, the analyzing rays are amplified, thereby it is possible to increase the sensitivity of the analysis.