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RADIATIVE PROPERTY MEASURING DEVICE OF LASER DIODE

机译:激光二极管的辐射性能测量装置

摘要

PURPOSE:To obtain a radiative property measuring device of a laser diode of a high accuracy of measuring position even though its optical path is made longer. CONSTITUTION:A reflecting mirror 2 to reflect the radiating light of a laser diode 1 is attached to an arm 4, the arm 4 is rotated around a rotation axis 5, and the reflected light of the reflecting mirror 2 is received by a receiving element 3. The extension 11 of the rotation axis 5 and a normal 12 passing through the center 3A of the luminous surface of the receiving element 3 are made coincident, while a normal 13 passing through the center 1A of the luminous surface of the laser diode 1 and the extension 11 of the rotation axis 5 are crossed square, the arm 4 is provided parallel to the normal 13, the normal 13 is reflected at the reflection point 2A of the reflecting mirror 2, it is crossed with the normal 12 by a normal 14 passing through the reflection point 2A, and the angle alpha composed by the point 3A-the point 2A-the point 1A is divided into two equal angles.
机译:用途:即使光程较长,也能获得具有高精度测量位置的激光二极管辐射性能测量装置。组成:一个反射激光镜1的辐射光的反射镜2安装在臂4上,臂4绕旋转轴5旋转,反射镜2的反射光被接收元件3接收使旋转轴5的延伸部分11和穿过接收元件3的发光表面的中心3A的法线12重合,同时使穿过激光二极管1的发光表面的中心1A的法线13与激光二极管1的发光表面的中心1A重合。旋转轴5的延长线11与正方形正交,臂4与法线13平行设置,法线13在反射镜2的反射点2A处反射,法线12与法线12交叉。穿过反射点2A,并且由点3A-点2A-点1A组成的角度α被分成两个相等的角度。

著录项

  • 公开/公告号JPH04315926A

    专利类型

  • 公开/公告日1992-11-06

    原文格式PDF

  • 申请/专利权人 ANDO ELECTRIC CO LTD;

    申请/专利号JP19910108178

  • 发明设计人 TAKATSUKA TOMOHIDE;

    申请日1991-04-15

  • 分类号G01J1/00;G01J1/04;G01M11/00;H01S5/00;

  • 国家 JP

  • 入库时间 2022-08-22 05:40:21

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