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RADIATIVE PROPERTY MEASURING DEVICE OF LASER DIODE
RADIATIVE PROPERTY MEASURING DEVICE OF LASER DIODE
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机译:激光二极管的辐射性能测量装置
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摘要
PURPOSE:To obtain a radiative property measuring device of a laser diode of a high accuracy of measuring position even though its optical path is made longer. CONSTITUTION:A reflecting mirror 2 to reflect the radiating light of a laser diode 1 is attached to an arm 4, the arm 4 is rotated around a rotation axis 5, and the reflected light of the reflecting mirror 2 is received by a receiving element 3. The extension 11 of the rotation axis 5 and a normal 12 passing through the center 3A of the luminous surface of the receiving element 3 are made coincident, while a normal 13 passing through the center 1A of the luminous surface of the laser diode 1 and the extension 11 of the rotation axis 5 are crossed square, the arm 4 is provided parallel to the normal 13, the normal 13 is reflected at the reflection point 2A of the reflecting mirror 2, it is crossed with the normal 12 by a normal 14 passing through the reflection point 2A, and the angle alpha composed by the point 3A-the point 2A-the point 1A is divided into two equal angles.
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