首页> 外国专利> CALIBRATION INSTRUMENT FOR MEASURING INSTRUMENT OF LIGHT SCATTERED PARTICLE DIAMETER DISTRIBUTION AND CONCENTRATION

CALIBRATION INSTRUMENT FOR MEASURING INSTRUMENT OF LIGHT SCATTERED PARTICLE DIAMETER DISTRIBUTION AND CONCENTRATION

机译:用于测量光散射颗粒直径分布和浓度的仪器的校准仪器

摘要

PURPOSE:To calibrate a measuring instrument extremely easily with high accuracy by using a calibration instrument constituted by arranging many circular or opaque disks which have a diameter =20 times the wavelength of light at random. CONSTITUTION:The calibration instrument is formed by forming at random circular holes 7 which have a diameter =20 times the wavelength of light in a opaque flat plate 6 or arranging multiple opaque disks 9 having said diameter on a transparent flat plate 8. Plural calibration instruments which differ in the diameter and number of the circular holes 7 or disks 9 are put in a particle group 3 and an intensity distribution obtained on a focal plane 2 is analyzed to find a parameter X1 of a concentration calibration line. Then a proportional coefficient K is determined from the relation between 4/3pia3N and X1, where N is the number of the circular holes 7 and (a) is their diameter. Consequently, the proportional coefficient K can be determined by a measurement optical system itself and the measuring instrument is calibrated extremely easily with high accuracy.
机译:目的:通过使用校准仪器,以极容易的方式高精度地校准测量仪器,该校准仪器由许多圆形或不透明的圆盘组成,其直径随机大于或等于光波长的20倍。组成:校准仪器是通过在不透明平板6上形成直径大于或等于光波长的20倍的随机圆孔7或在透明平板8上排列多个具有所述直径的不透明盘9制成的。将圆孔7或圆盘9的直径和数量不同的仪器放入颗粒组3中,分析在焦平面2上获得的强度分布,以找到浓度校准线的参数X1。然后从4 / 3pia 3 N和X 1之间的关系确定比例系数K,其中N是圆孔7的数量,(a)是它们的直径。因此,比例系数K可以由测量光学系统本身确定,并且非常容易以高精度校准测量仪器。

著录项

  • 公开/公告号JPH0460546B2

    专利类型

  • 公开/公告日1992-09-28

    原文格式PDF

  • 申请/专利号JP19870098216

  • 发明设计人 HAYASHI SHIGERU;

    申请日1987-04-21

  • 分类号G01N15/00;G01N15/02;

  • 国家 JP

  • 入库时间 2022-08-22 05:37:57

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