首页> 外国专利> METHOD AND APPARATUS FOR DETERMINING THERMAL RESISTANCE AND STRUCTURAL INTEGRITY OF COATINGS ON CONDUCTING MATERIALS BY MONITORING ELECTRICAL CONDUCTANCE OF THE UNDERLYING MATERIAL UPON LOCALIZED HEATING OF THE OVERLYING COATING

METHOD AND APPARATUS FOR DETERMINING THERMAL RESISTANCE AND STRUCTURAL INTEGRITY OF COATINGS ON CONDUCTING MATERIALS BY MONITORING ELECTRICAL CONDUCTANCE OF THE UNDERLYING MATERIAL UPON LOCALIZED HEATING OF THE OVERLYING COATING

机译:通过监测覆盖层的局部加热后基础材料的电导率来确定导电材料上的涂层的热阻和结构完整性的方法和装置

摘要

A system for nondestructive analysis of barrier coatings on electrically conductive materials includes imposition of a controlled known heat load (16) to a localized area of the coating (12) and measuring electrical conductivity of the underlying material (10) at or near the localized area of the coating (12). The electrical conductivity of the material (10) is affected by changes in temperature related to thermal conduction into the material (10) through the coating (12). Thermal resistance of the coating (12) and defects between the coating (12) and the material (10) can therefore be detected.
机译:用于对导电材料上的阻隔涂层进行非破坏性分析的系统,包括将受控的已知热负荷(16)施加到涂层(12)的局部区域上,并在该局部区域或附近测量基础材料(10)的电导率涂层(12)的厚度。材料(10)的电导率受与通过涂层(12)进入材料(10)的热传导有关的温度变化的影响。因此可以检测涂层(12)的热阻以及涂层(12)和材料(10)之间的缺陷。

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