Circuit for measuring the dynamic characteristics of a housing for a high-speed integrated circuit, and method of measuring these dynamic characteristics

摘要

The circuit measures the dynamic characteristics of housings for encapsulating high-speed integrated circuits (1 GHz). It consists of at least two amplifiers (4, 5) integrated onto a semiconductor substrate (3). These amplifiers have the same input and output impedances as those of the high-speed circuit to be encapsulated in the housing. The amplifiers (4, 5) are laid out in such a way that there is no internal coupling. Depending on the particular measurements to be made, the two amplifiers are mounted in parallel (4, 5) or anti-parallel (5, 6). To measure the dynamic characteristics of a housing, a measuring circuit is mounted in a housing and a signal (Ve) is addressed to an input connection (11) of the housing. From the measurement of the signal (Vs) received at an output connection (15), the transmission coefficient (T) and the coupling coefficient (C) are measured. …IMAGE…