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DRAM cell field architecture with superposed bitline switches and bitlines

机译:具有重叠的位线开关和位线的DRAM单元场架构

摘要

The invention relates to a DRAM cell field architecture, in which, in each individual memory block, bit switches (5 to 12) are used to select in each case from a plurality of bit line pairs one bit line pair (BLj, BLj+2), and of the bit line pairs respectively selected in each memory block in turn only the bit line pairs of the selected memory block are switched through to the superposed bit lines (IOk to IOk+3). The superposed bit lines may in this case run together with the superposed bit switch lines (CSLk to CSLk+3), driving the bit switches, on a single, for example the second, metallisation level, thereby better utilising the said level. Due to the invention, depending on the required degree of parallelism, it is possible to save interpreters on account of the superposed bit lines, retaining the advantage in individual access of a short access time with moderate power consumption. IMAGE
机译:本发明涉及一种DRAM单元场结构,其中在每个单独的存储块中,使用位开关(5至12)分别从多个位线对中选择一个位线对(BLj,BLj + 2)然后,在分别在每个存储块中选择的位线对中,仅将所选存储块的位线对切换到叠加的位线(IOk至IOk + 3)。在这种情况下,叠置的位线可以与叠置的位开关线(CSLk至CSLk + 3)一起运行,以单个(例如第二)金属化水平驱动位开关,从而更好地利用所述水平。由于本发明,取决于所需的并行度,可以由于位线的重叠而节省解释器,从而保留了在具有中等功耗的情况下以较短的访问时间进行单个访问的优点。 <图像>

著录项

  • 公开/公告号EP0450159A3

    专利类型

  • 公开/公告日1992-06-03

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号EP19900123237

  • 发明设计人 LUSTIG BERNHARD DR. RER. NAT.;

    申请日1990-12-04

  • 分类号G11C11/409;G11C5/06;

  • 国家 EP

  • 入库时间 2022-08-22 05:29:52

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