DEVICE FOR MEASURING RADIATION SOURCE INDICATRIX AND SCATTERING OF SPECIMENS UNDER ACTION OF RADIATION BEAMS UPON THEM

摘要

Usage: in analytical apparatus in the study of the optical properties of various materials in the process of exposing them to intense beams of electromagnets or ionizing radiation SUMMARY OF THE INVENTION: ustroystg.o includes sample 1, which is exposed to the radiation beam 2, flexible polarizer 3