DEVICE FOR MEASURING SPATIAL INDICATRIX OF RADIATION SCATTERING

摘要

FIELD: measurement.;SUBSTANCE: invention can be used in measurement equipment and optical instrument-making for measuring spatial indicatrix of radiation scattering from surface of analyzed sample of material. Device has simple design and technical implementation. Device includes a source of collimated light beam, a rotary platform, detachable attachment assemblies of the sample of the material, a photodetector, photodetector movement units and rotation of the rotary platform, a photodetector signal processing unit and a control unit. Rotary platform provides rotation of material sample around axis, which coincides with axis of light beam, has axial hole and is made with possibility of installation on it of detachable assemblies of specimen material fixation. Each of the detachable assemblies is made in the form of a bushing with an axial hole and a holder of the sample of material installed on the end of the bushing, having a central hole, diameter of which is not less than diameter of the axial bore of the bushing. Sample holder is configured to set any section of the surface of the sample of material on the path of the light beam. Detachable attachment assemblies of the material sample differ from each other by the value of the angle between the normal to the plane of the sleeve end and the axis of the sleeve. Axis of the bushing and the axis of rotation of the platform coincide with the axis of the light beam, and diameters of the axial holes of the sleeve and the rotary platform exceed the diameter of the light beam. Photodetector is configured to move along a circle whose center coincides with the center of the illumination spot of the sample of material, which confines a circle whose plane passes through the axis of rotation of the sample. Control unit is connected with photodetector movement unit and rotary platform rotation assembly and is made with possibility to control these units. Control unit is also configured to process data coming from the photodetector signal processing unit and to present measurement results of the spatial radiation scattering indicatrix.;EFFECT: technical result consists in providing measurement of spatial indicatrix of radiation scattering from surface of sample with coverage of multiple different directions, significant increase in array of measured values of scattering radiation intensity, including when sample illumination angle varies.;3 cl, 2 dwg