首页>
外国专利>
Sensing path arrangement for test circuits, e.g. for testing RAM(s) - has two groups of registers in series with controller managing priority of shift operation of first gp.
Sensing path arrangement for test circuits, e.g. for testing RAM(s) - has two groups of registers in series with controller managing priority of shift operation of first gp.
A sensing path arrangement contains a first sensing register group (10) with a number of first sensing registers connected in series, a second group (20, 30) connected in series with the output of the first group and with registers in series and a controller (60). The controller regulates the first and second groups of registers so that the second group's shift operation is interrupted and the first group's shift operation is carried out. It applies a shift clock signal to the first group and applies a clock signal to the second group depending on a defined control signal. ADVANTAGE - wiring of arrangement is simplified and testing efficiency increased.
展开▼