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Process for the production of dielectric thin films; pyroelectric sensor

机译:电介质薄膜的生产工艺;热释电传感器

摘要

A process for producing a dielectric thin film of a compound oxide of a high-melting metal and a low-melting metal by vapor-depositing the compound oxide onto a substrate, characterised in that said substrate or the vapour phase is irradiated with a laser beam during vapour deposition. The vapour deposition of the compound oxide onto the substrate may be carried out by irradiating the compound oxide as a target with a laser beam. The laser beam irradiating the substrate or vapour phase, 11, has a higher energy than the laser irradiating the target 6 (Fig 1). Specific examples of compound oxides are Pb(Zr, Ti)O3; (Pb, La) (Zr, Ti)O3; (Pb, La)TiO3; BaTaO3; LiTaO3; and LiNbO3, and may be deposited by sputtering, CVD, molecular beam epitaxy and electron beam methods. In one method evaporation is carried out in an oxygenous atmosphere with a partial pressure of oxygen of 0.06 Torr or more. There is also provided a pyroelectric type of sensor (Fig 11) comprising: a MOS element including a drain electrode (5), a source electrode (6), a gate electrode (7) and an Si semiconductor and a film of a ferroelectric or pyroelectric material formed on the drain electrode, the drain electrode being made of a material which exhibits a good ohmic contact with Si or SiO2 and has a latice constant close to that of ferroelectric or pyroelectric material. The film of ferroelectric or pyroelectric material may be obtained by irradiating a target comprising a compound oxide of a high-melting metal and a low-melting metal with a laser beam to vapour-deposit the compound oxide onto said drain electrode. The drain electrode may be made of two materials, the part connected to the Si semiconductor made of a material that exhibits a good ohmic contact with Si or SiO2 eg Al, and the other part on which the film of ferroelectric or pyroelectric material is to be formed made of a material that has a lattice constant close to that of the ferroelectric or pyroelectric material, eg Pt. The MOS element may be used in a liquid crystal display. IMAGE
机译:通过将复合氧化物气相沉积在衬底上而制备高熔点金属和低熔点金属的复合氧化物的介电薄膜的方法,其特征在于,所述衬底或气相被激光束照射。在气相沉积过程中。可以通过用激光束照射作为靶的复合氧化物来将复合氧化物气相沉积在基板上。照射衬底或气相11的激光束具有比照射靶6(图1)的激光更高的能量。复合氧化物的具体例子是Pb(Zr,Ti)O 3。 (Pb,La)(Zr,Ti)O3; (Pb,La)TiO3; BaTaO3;钽酸锂;可以通过溅射,CVD,分子束外延和电子束方法沉积。在一种方法中,蒸发在含氧分压为0.06托或更高的含氧气氛中进行。还提供了一种热电型传感器(图11),该传感器包括:MOS元件,包括漏极(5),源极(6),栅极(7)和Si半导体以及铁电薄膜或铁电薄膜。在漏电极上形成的热电材料,该漏电极由与Si或SiO2表现出良好的欧姆接触并具有接近铁电或热电材料的晶格常数的材料制成。可以通过用激光束照射包含高熔点金属和低熔点金属的复合氧化物的靶以将所述复合氧化物气相沉积在所述漏电极上来获得铁电或热电材料的膜。漏电极可以由两种材料制成,与Si半导体连接的部分由与Al或Si或SiO 2表现出良好的欧姆接触的材料制成,另一部分将在其上形成铁电或热电材料膜由晶格常数接近铁电或热电材料的晶格常数的材料(例如Pt)制成。 MOS元件可以用在液晶显示器中。 <图像>

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