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Method of directly deriving amplitude and phase information of an object from images produced by a high-resolution electron microscope
Method of directly deriving amplitude and phase information of an object from images produced by a high-resolution electron microscope
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机译:从高分辨率电子显微镜产生的图像中直接得出物体的幅度和相位信息的方法
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摘要
A high-resolution electron microscope (1) comprising a detection system (11), an image processing system (13) and an effective electron source (3) ensuring a comparatively small thermal energy spread of the electrons to be emitted is suitable for executing a method for directly deriving amplitude and phase information of an object (17) in the form of an electron wave function &phgr;. To this end, a number of images of an object (17) are recorded by means of a high-resolution electron microscope (1) in image planes (19) with defocus values which differ only slightly. Thus, a substantially continuous series of images is formed as a function of the defocus value, resulting in a substantially three- dimensional image area. A quasi-three-dimensional Fourier transformation is performed thereon in order to separate linear and non-linear image information for the reconstruction of the electron wave function. In practice a two-dimensional Fourier transformation is applied to the recorded images which are subsequently multiplied by a complex weighting factor, followed by summing. As a result, the linear information is concentrated on two spheres in the Fourier space, the non- linear information being uniformly distributed across the Fourier space.
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