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METHOD FOR MIRROR-LIKE POLISHING SILICON SINGLE CRYSTAL WAFER

机译:硅单晶晶片镜面抛光的方法

摘要

PURPOSE:To provide a method for mirror-like polishing a silicon single crystal wafer having high flatness and completely free from work strain layer by a chemical etching means. CONSTITUTION:A method for mirror-like polishing the surface of a silicon wafer by etching comprises immersing a cut silicon wafer 1 and anodes consisting of linearly stretched out platinum wires or platinum-plated metal wires 16 in a mixture of dilute sulfuric acid and hydrofluoric acid, substantially in parallel in a mutually extremely approached state, subjecting the anodes to electrolytic reaction with a high electric current density of =0.5A/cm2 on the surfaces of the anodes to generate ozone at places near the anodes, oxidizing the surface of the silicon wafer with highly active oxygen produced by the decomposition of the ozone, and subsequently reacting, the produced silicon dioxide with the hydrofluoric acid to remove the silicon dioxide as hydrogen silicon-fluoride.
机译:目的:提供一种通过化学蚀刻手段镜面抛光具有高平坦度并且完全没有工作应变层的硅单晶晶片的方法。组成:一种通过蚀刻对硅晶片表面进行镜面抛光的方法,该方法包括将切割的硅晶片1和阳极(由线性拉伸的铂丝或镀铂金属丝16组成)浸入稀硫酸和氢氟酸的混合物中在相互接近的状态下基本上平行地进行,使阳极在阳极表面上以> = 0.5A / cm 2的高电流密度进行电解反应,从而在阳极附近的位置处产生臭氧,从而氧化阳极。通过臭氧分解产生的高活性氧使硅晶片表面产生高活性氧,随后使产生的二氧化硅与氢氟酸发生反应,从而除去二氧化硅,即氟化氢硅。

著录项

  • 公开/公告号JPH04367593A

    专利类型

  • 公开/公告日1992-12-18

    原文格式PDF

  • 申请/专利权人 KYOTO HANDOTAI KK;

    申请/专利号JP19910169000

  • 发明设计人 ABE YASUHIKO;

    申请日1991-06-14

  • 分类号C30B29/06;

  • 国家 JP

  • 入库时间 2022-08-22 05:15:07

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