首页> 外国专利> YARN DEFECT DETECTOR MAINLY IN THICK PLACE OR IN THIN PLACE

YARN DEFECT DETECTOR MAINLY IN THICK PLACE OR IN THIN PLACE

机译:纱疵检测器主要位于较厚的地方或较薄的地方

摘要

PURPOSE: To properly judge the defect in a thick place or thin place by integrating thickness signal over plural wave forms. ;CONSTITUTION: Signals concerning thickness of a yarn T during running movement are amplified and an abnormal signal exceeding the prescribed sensitivity level is discriminated with a relative circuit 16. A detection signal which passed through a switch circuit 17 in which only abnormal signal is passed through as a detection signal of plural wave forms is completely integrated in integrated state over plural wave forms to the direction of length of yarn in prescribed length range by a complete integration circuit. Whether the integrated value is a defect indicating signal out of prescribed sensitivity level or not is judged with a relative circuit 20 and the defect part is removed through a cutter driving circuit 21 by the defect indicating signal.;COPYRIGHT: (C)1993,JPO&Japio
机译:目的:通过对多个波形上的厚度信号进行积分,正确判断厚处或薄处的缺陷。 ;组成:关于运行中的纱线T的粗细的信号被放大,并且通过相关电路16辨别出超过规定灵敏度水平的异常信号。检测信号通过开关电路17,其中仅异常信号通过由于通过完整的积分电路,多个波形的检测信号以预定状态在纱线的长度方向上以预定的长度范围在多个波形上以积分状态被完全积分。用相关电路20判断该积分值是否是超出规定灵敏度水平的缺陷指示信号,并且通过该缺陷指示信号通过切割器驱动电路21去除该缺陷部分。;版权:(C)1993,JPO&Japio

著录项

  • 公开/公告号JPH0598527A

    专利类型

  • 公开/公告日1993-04-20

    原文格式PDF

  • 申请/专利权人 OKUDA KAZUHIKO;

    申请/专利号JP19910280755

  • 发明设计人 OKUDA KAZUHIKO;

    申请日1991-09-30

  • 分类号D01H13/22;

  • 国家 JP

  • 入库时间 2022-08-22 05:13:07

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