process for the realization of metrological structures particularly for the direct measurement of errors introduced by systems of alignment.

• 1. 过程测量系统对准装置和用于测量过程变量的系统 [P] . 中国专利： CN204679124U . 2015.09.30
• 2. 用于在多传感器系统中、特别是在以用于过程自动化技术的测量装置的形式的现场装置中操作传感器的方法和用于执行该方法的传感器 [P] . 中国专利： CN102782453B . 2015.09.23
• 3. process for the realization of metrological structures particularly for the direct measurement of errors introduced by systems of alignment. [P] . IT1252539B . 1995-06-19

  机译： 用于实现计量结构的过程，特别是用于直接测量对准系统引入的误差的过程。

• 4. process for the realization of metrological structures particularly for the direct measurement of errors introduced by alignment systems [P] . ITMI913385D0 . 1991-12-18

  机译： 实现计量结构的过程，尤其是直接测量对准系统引入的误差的过程

• 5. Process for producing metrological structures particularly for direct measurement of errors introduced by alignment systems [P] . 美国专利： US5622796A . 1997-04-22

  机译： 生产计量结构的方法，特别是用于直接测量对准系统引入的误差的方法

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• 1. Analysis of the Antenna＇s Setup Errors at the Global Navigation Satellite System Measurements [J] . Evangelia Lambrou . 土木工程与建筑 . 2013,第010期
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