首页> 外国专利> Plastic encapsulated semiconductor device incorporating a heat sink of metal having controlled roughness contact surfaces, and method of making the same

Plastic encapsulated semiconductor device incorporating a heat sink of metal having controlled roughness contact surfaces, and method of making the same

机译:包含具有受控粗糙度接触表面的金属散热器的塑料封装半导体器件及其制造方法

摘要

A structure is disclosed which comprises a metal plate (12), a chip of a semiconductor material (13) attached to the plate (12), terminal rheophores (11), interconnection wires (18) between the rheophores (11) and the metallized regions (17) of the chip (13), and a plastics body (10) encapsulating all this with the exception of a surface of the plate (12) and part of the rheophores (11). To achieve improved bond between the plastics and the metal, predetermined areas (30,32,33) of the plate (12) and the rheophores (11) have a higher roughness than 1(Ra=1µm).
机译:公开了一种结构,该结构包括金属板(12),附接到该板(12)的半导体材料的芯片(13),端子流变体(11),流变体(11)和金属化层之间的互连线(18)。芯片(13)的两个区域(17),以及除了板(12)的表面和部分的发色团(11)以外的所有封装塑料的塑料体(10)。为了实现塑料和金属之间的改进的结合,板(12)和流变材料(11)的预定区域(30、32、33)具有比1(Ra =1μm)更高的粗糙度。

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