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METHOD AND APPARATUS FOR MEASURING STRENGTH RATE IN THICKNESS DIMENSIONS

机译:厚度尺寸强度率的测量方法和装置

摘要

An object of the present invention is to provide a method and an apparatus for measuring the stiffness in the thickness direction of a polymer film which can obtain accurate measurement values by applying a load continuously.;In order to realize this, in the present invention, a normal load is continuously applied to a sample cell in the absence of a test piece to obtain a deformation amount by converting a voltage through the LVDT, and then a load is applied to the test piece in a state where the test piece is placed, And a method and an apparatus for measuring the stiffness in the thickness direction of the polymer film to obtain the deformation and the load relation of only the test piece due to the difference of the deformation amounts.
机译:本发明的目的是提供一种用于测量聚合物膜的厚度方向上的刚度的方法和设备,该方法和设备可以通过连续施加载荷来获得准确的测量值。为了实现这一点,在本发明中,在不存在测试件的情况下,将正常的负载连续施加到样品池,通过通过LVDT转换电压来获得变形量,然后在放置测试件的状态下将负载施加到测试件,以及一种用于测量聚合物膜的厚度方向上的刚度以获得仅由于变形量的差异而导致的试件的变形和载荷关系的方法和设备。

著录项

  • 公开/公告号KR930010544A

    专利类型

  • 公开/公告日1993-06-22

    原文格式PDF

  • 申请/专利权人 하기주;

    申请/专利号KR19910019453

  • 发明设计人 김진사;

    申请日1991-11-01

  • 分类号G01N27/00;

  • 国家 KR

  • 入库时间 2022-08-22 05:04:15

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