Boundary-scan test method and apparatus for diagnosing faults in a device under test

摘要

An apparatus for diagnosing faults in a device equipped with boundary- scan test capability stores serial test data upon detection of a fault in a device under test (DUT). Test data corresponding to a frame vector associated with the fault is formatted so that all information from parallel tester inputs and TAP scan registers can be simultaneously analyzed. A method for diagnosing faults is also disclosed.