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Success or failure decision method null of suffering inspection material such as

机译:诸如检验材料之类的成败决定方法无效

摘要

PURPOSE:To obviate overestimating and overlooking of sub-source flaws by combining the results of flaw detections by various flaw detection methods including surface flaw detection, angle beam flaw detecting and normal beam internal flaw detection to make decision on acceptance or rejection of a material to be inspected. CONSTITUTION:The material to be inspected such as billet is subjected to the flaw detection by the surface flaw detection using a surface flaw detector such as magnetic particle flaw detector, the ultrasonic angle beam flaw detection using an ultrasonic flaw detector and the ultrasonic normal beam internal flaw detection, respectively. As to the flaws shallower in the evaluated flaw depth than the flaw removing limiting value among all the flaws detected by the surface flaw detection and the flaws detected by the angle beam flaw detection, the flaws in the respective evaluated flaw positions are removed down to the flaw removing limiting value. The flaws which are detected by the normal beam internal flaw detection and the flaws which are deeper in the evaluated flaw depth among the flaws detected by the angle beam flaw detection are processed as the internal flaws (including the sub-surface flaws).
机译:目的:通过结合各种探伤方法(包括表面探伤,角束探伤和法线束内部探伤)的探伤结果来避免对子源探伤的高估和忽略,从而决定材料的接受或拒绝。被检查。组成:待检查的材料,例如坯料,通过使用表面缺陷检测器(例如磁性粒子缺陷检测器)进行表面缺陷检测,使用超声缺陷检测器进行超声角束缺陷检测以及超声法线束内部进行缺陷检测探伤分别。对于在通过表面缺陷检测所检测出的所有缺陷和通过角束缺陷检测所检测出的所有缺陷中,在评估缺陷深度中比缺陷去除极限值浅的缺陷,将各个评估缺陷位置中的缺陷去除至缺陷消除极限值。将通过普通束内部缺陷检测所检测出的缺陷以及在通过角度束缺陷检测所检测出的缺陷之中,在评估出的缺陷深度上更深的缺陷作为内部缺陷(包括表面缺陷)进行处理。

著录项

  • 公开/公告号JPH0677000B2

    专利类型

  • 公开/公告日1994-09-28

    原文格式PDF

  • 申请/专利权人 株式会社神戸製鋼所;

    申请/专利号JP19870058378

  • 发明设计人 油谷 憲治;

    申请日1987-03-12

  • 分类号G01N29/22;G01N29/10;

  • 国家 JP

  • 入库时间 2022-08-22 04:55:36

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