TESTING APPARATUS OF INTERMITTENT LIFE OF SEMICONDUCTOR ELEMENT

摘要

PURPOSE: To provide a testing apparatus of the intermittent life of a semiconductor element which can easily control temperatures of the to-be-tested semiconductor element and can detect an abnormal mode. ;CONSTITUTION: The apparatus is provided with an intermittent life testing device 1₁, a temperature sensor T₁ securely fixed to a to-be-tested semiconductor element 2₁ and a cooling fan 4₁. The intermittent life testing device 1₁ has a direct current voltage source 3 which can supply a large current via the to-be-tested semiconductor element 2₁, a temperature controller 5, a window comparator comprising comparators A₁, A₂ for detecting the shortcircuited or opened state of the element 2₁, a transistor Q for controlling a relay L₁ thereby to control the supply of electricity to the element 2₁, and a direct current amplifying circuit A₃ for feeding a bias to the transistor Q. A plurality of the intermittent life testing device as above are set in parallel.;COPYRIGHT: (C)1994,JPO&Japio