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SPECTRAL ANALYTICAL METHOD BY LASER EMISSION USING TWO STEP EXCITATION METHOD

机译:激光激发的两步激发光谱分析法

摘要

PURPOSE: To provide the title device utilized in the element concentration analysis of a solid or molten metal. ;CONSTITUTION: In a laser emission spectral analyzer, a laser beam from a laser oscillator 1 is convergently emitted on a surface of a sample S, the luminous intensity from plasma 4 formed is measured by a spectroscope 7, and the concentration of a target element is analyzed, by a previously given calibration curve in an analyzer 8. A laser oscillator 9 for excitation is added to the laser emission spectral analyzer, and the laser beam EL for excitation thereof is emitted on the plasma 4 through a prism 10. Thus, in analyzing with the two step excitation method in which the plasma 4 is excited at two steps, the deflection intensity of the laser beam EL passed through the plasma 4 is measured by using a laser beam detector 12. The prism 10 is controlled according to the deflection intensity through an operation controller 14, thereby the positioning of the laser beam EL within the plasma is carried out, and the element analysis can be very accurately done.;COPYRIGHT: (C)1994,JPO&Japio
机译:目的:提供用于固体或熔融金属元素浓度分析的标题设备。 ;组成:在激光发射光谱分析仪中,来自激光振荡器1的激光束会聚地发射到样品S的表面上,由分光镜7测量形成的等离子体4的发光强度,并测量目标元素的浓度。在分析器8中通过预先给定的校准曲线来分析。用于激发的激光振荡器9被添加到激光发射光谱分析器中,并且用于激发其的激光束EL通过棱镜10被发射到等离子体4上。因此,在通过两步激发等离子体4的两步激发法进行分析时,通过使用激光束检测器12测量通过等离子体4的激光束EL的偏转强度。通过操作控制器14的偏转强度,从而在等离子体内进行激光束EL的定位,并且可以非常精确地进行元素分析。;版权:(C)1994,JPO&Japio

著录项

  • 公开/公告号JPH06241999A

    专利类型

  • 公开/公告日1994-09-02

    原文格式PDF

  • 申请/专利权人 KAWASAKI STEEL CORP;

    申请/专利号JP19930031697

  • 发明设计人 YAMAMOTO AKIRA;TANIMOTO WATARU;

    申请日1993-02-22

  • 分类号G01N21/63;

  • 国家 JP

  • 入库时间 2022-08-22 04:50:16

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