METHOD FOR IMAGING MAGNETIC STRUCTURE OR MAGNETIC DOMAIN OF SAMPLE AND MEMORY APPARATUS, WHEREIN METHOD THEREOF IS APPLIED

摘要

PURPOSE: To provide a STM technique widely applicable to conductive, semiconductive, and nonconductive magnetic materials for test and data storage. CONSTITUTION: A device and method for imaging the magnetic structure or magnetic section of a sample 14 comprises a scanning tunnel microscope(STM) 52, a voltage generator 66 for changing the voltage of a tip 12, an ammeter 64 for measuring the current passing the tip, a circuit 63 for determining the tip voltage in O-current, and a current source 63 for carrying a current in the longitudinal direction of the sample. Further, a device for removing the applied magnetic field where a magnetic field orthogonal to the current carried in the sample is applied is provided within the surface of the sample.