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ARRANGEMENT FOR MEASURING HEAT-VARIABLE DC AND/OR HIGH FREQUENCY PARAMETERS OF THE SEMICONDUCTOR DEVICES IN THE COURSE OF OPERATION AND THERMOSTAT FOR OPERATING AND/OR MEASURING SEMICONDUCTOR DEVICES IN A FILED OF VARIABLE TEMPERATURE
ARRANGEMENT FOR MEASURING HEAT-VARIABLE DC AND/OR HIGH FREQUENCY PARAMETERS OF THE SEMICONDUCTOR DEVICES IN THE COURSE OF OPERATION AND THERMOSTAT FOR OPERATING AND/OR MEASURING SEMICONDUCTOR DEVICES IN A FILED OF VARIABLE TEMPERATURE
