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Mfg. semiconductor element with differently doped layers - by wafer silicon@ bonding and wafer thinning

机译:制造具有不同掺杂层的半导体元件-通过晶圆硅@键合和晶圆减薄

摘要

In the prodn. of semiconductor elements with differently doped layers, in which two or more doped silicon wafers are joined by silicon bonding, the novelty is that the thickness of at least one of the wafers is reduced by machining (esp. grinding or chemical machining) after silicon bonding and that at least one of the wafers has heavy doping. The dopant distribution in the wafers can be modified in the wafers by a diffusion process and, subsequently, the charge carrier lifetime can be increased by a gettering process. The heavily doped wafer may be used as dopant source for the other wafer(s) in the diffusion operation. ADVANTAGE - The semiconductor elements can be produced without lengthy deep diffusion operations and the risk of wafer fracture is much reduced so that larger wafer diameters can be used.
机译:在产品中在具有不同掺杂层的半导体元件中,其中两个或更多个掺杂硅晶片通过硅键合而接合,其新颖之处在于,至少一个晶片的厚度通过硅键合后的机械加工(尤其是研磨或化学机械加工)而减小并且至少一个晶片具有重掺杂。晶片中的掺杂剂分布可以通过扩散工艺在晶片中改变,并且随后,可以通过吸气工艺来增加电荷载流子的寿命。在扩散操作中,重掺杂晶片可以用作其他晶片的掺杂源。优势-无需长时间的深扩散操作即可生产半导体元件,并且大大降低了晶圆破裂的风险,因此可以使用更大的晶圆直径。

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