首页> 外国专利> Copper@ alloy contact backing material for semiconductor use - has excellent adhesion compared to epoxy resin sealants, and contains nickel@, silicon, zinc@, magnesium@, tin@, etc.

Copper@ alloy contact backing material for semiconductor use - has excellent adhesion compared to epoxy resin sealants, and contains nickel@, silicon, zinc@, magnesium@, tin@, etc.

机译:半导体用铜合金触点衬里材料-与环氧树脂密封胶相比具有极好的粘合力,并且包含镍,硅,锌,镁,锡等。

摘要

A Cu-alloy contact backing material for use in resin-encapsulated semiconductor devices has the compsn. in wt.%: 1-4 Ni, 0.1-1 Si, 0.1-2 Zn, 0.001-0.05 Mg, 0.05-1 Sn, balance Cu plus impurities, namely max. 20 ppm S and max. 20 ppm C. Pref. compsn. in wt.% is 2.0-3.8 Ni, 0.3-0.9 Si, 0.2-1.5 Zn, 0.003-0.03 Mg, 0.15-0.8 Sn, balance Cu and impurities, namely max. 15 ppm S and max. 10 ppm C. ADVANTAGE - Excellent adhesion strength compared to epoxy resin sealants.
机译:用于树脂封装的半导体器件的铜合金接触衬里材料具有优势。重量百分比:1-4 Ni,0.1-1 Si,0.1-2 Zn,0.001-0.05 Mg,0.05-1 Sn,余量的Cu和杂质,即最大最高20 ppm S 20 ppmC。 compsn。以重量%计为2.0-3.8 Ni,0.3-0.9 Si,0.2-1.5 Zn,0.003-0.03 Mg,0.15-0.8 Sn,余量的Cu和杂质。最高15 ppm S 10 ppmC。优势-与环氧树脂密封胶相比具有出色的粘合强度。

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