首页> 外国专利> PROCEDURE AND PREPARATION FOR THE CONTACT MEASUREMENT OF ELECTRICAL SPANGES IN A MEASUREMENT OBJECT WITH AN ISOLATOR AREA.

PROCEDURE AND PREPARATION FOR THE CONTACT MEASUREMENT OF ELECTRICAL SPANGES IN A MEASUREMENT OBJECT WITH AN ISOLATOR AREA.

机译:具有隔离器区域的测量对象中的电接触的接触式测量的过程和准备工作。

摘要

PCT No. PCT/DE92/00014 Sec. 371 Date Aug. 3, 1993 Sec. 102(e) Date Aug. 3, 1993 PCT Filed Jan. 10, 1992 PCT Pub. No. WO92/14162 PCT Pub. Date Aug. 20, 1992.A method and device for contactless measurement of electric voltages in a unit under measurement with an insulating surface, a primary electron beam being directed onto the insulating surface of the unit. The energy of the secondary electrons in a secondary electron flow generated at the insulating surface of the unit is measured and the potential of a conducting zone located below the insulating surface of the unit is derived from this measurement. In order to increase the measurement precision, an electric alternating absorption field is generated above the unit under measurement and the measurement of the energy of the secondary electrons is carried out in synchronism with the alternating field.
机译:PCT号PCT / DE92 / 00014第二部分371日期1993年8月3日102(e),1993年8月3日,PCT,1992年1月10日提交,PCT Pub。 WO92 / 14162 PCT公开号日期,1992年8月20日。一种用于非接触式测量被测单元中具有绝缘表面的电压的方法和装置,一次电子束被引导到该单元的绝缘表面上。测量在单元的绝缘表面处产生的二次电子流中的二次电子的能量,并从该测量中得出位于单元的绝缘表面下方的导电区的电势。为了提高测量精度,在被测单元的上方产生交变吸收电场,并且与交变场同步地进行二次电子的能量的测量。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号