首页> 外国专利> A process for the characterization of materials for use in the resonance - magneto flank geometry, a spectrometer for this characterization and method for calibration of this spectrometer.

A process for the characterization of materials for use in the resonance - magneto flank geometry, a spectrometer for this characterization and method for calibration of this spectrometer.

机译:表征用于共振的材料的过程-磁翼面几何形状,用于该表征的光谱仪以及该光谱仪的校准方法。

摘要

P method of characterization of materials for their use in magnetometry to resonance spectrometer for this characterization and method of calibration of the spectrometer. / p & & p & it determines the value of the greatest slope of the curve of a dispersion of the material to be tested, around a reference frequency fr. for this purpose, use is made of a spectrometer at the head of the bloch orientable and operating in a range of frequencies ranging from 1 to 2 mhz. The spectrometer, in order to make it possible to optimize the slope, must be calibrated by subjecting the coil 14 of the detection of a magnetic field known calibration and by measuring the voltage across the terminals of this coil 14. / p & & p & application to the classification of materials for their use in electron paramagnetic resonance. / p
机译:

表征材料的方法,以用于共振分析仪的磁力计中,以用于此表征和光谱仪的校准方法。 & &它确定在参考频率fr附近待测材料的色散曲线的最大斜率值。为了这个目的,使用了可在喷头顶部定向的光谱仪,并且该光谱仪在1-2MHz的频率范围内操作。为了使得能够优化斜率,必须通过使线圈14经受已知校准的磁场的检测并且通过测量该线圈14的端子两端的电压来对光谱仪进行校准。 & &应用于电子顺磁共振材料的分类。

著录项

  • 公开/公告号DE68912247T2

    专利类型

  • 公开/公告日1994-07-07

    原文格式PDF

  • 申请/专利权人 COMMISSARIAT ENERGIE ATOMIQUE FR;

    申请/专利号DE1989612247T

  • 发明设计人 DURET DENIS FR;BERANGER MARC FR;

    申请日1989-07-19

  • 分类号G01R33/24;G01R33/60;

  • 国家 DE

  • 入库时间 2022-08-22 04:35:15

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号