Device to characterize the dielectric properties of samples, whether or not their surface is flat, and use for non-destructive examination of dielectric homogeneity of samples.

摘要

The invention relates to a device for characterizing the dielectric properties of samples of materials having an even and/or an uneven surface, the device consisting of a probe (3) connected to a coaxial cable (2) through a connector (30) and being characterised in that the probe comprises a tubular conducting component (7), a conducting rod (8) coaxial with the tubular component (7), an annular component (10) made of a dielectric material housed in the tubular component (7) and rigidly attached to the rod (8), the system consisting of the rod (8) and the annular component (10) sliding in the tubular component (7) and opposing its resistance when its second end is in contact with the sample (4) so that good contact with the latter is ensured, the second end having at least one axis which coincides with a generating line of the sample surface in such a way that contact always occurs whether the surface is even or uneven. …??Application to non-destructive testing of the homogeneity of dielectric samples. …IMAGE…