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Epitaxy of high T.sub.c superconducting films on (001) silicon surface

机译:(001)硅表面上高Tc超导膜的外延

摘要

An epitaxial structure comprising a silicon containing substrate and a high T.sub.c copper-oxide-based superconducting layer, which may include an intermediate layer between the silicon substrate and the superconductor layer. Epitaxial deposition is accomplished by depositing a superconductor on a (001) surface of silicon in a manner in which the unit cell of the superconductor layer has two out of three of its crystallographic axes rotated 45 degrees with respect to the corresponding axes of the silicon unit cell, the remaining axis of the superconductor unit cell being normal to the Si (001) surface.
机译:外延结构,其包含含硅的衬底和高T.c.氧化铜基超导层,其可以包括在硅衬底和超导层之间的中间层。外延沉积是通过在硅的(001)表面上沉积超导体来实现的,其中超导体层的晶胞相对于硅单元的相应轴旋转了45度的三个晶轴中的两个单元,超导体单元的剩余轴垂直于Si(001)表面。

著录项

  • 公开/公告号US5296458A

    专利类型

  • 公开/公告日1994-03-22

    原文格式PDF

  • 申请/专利权人 INTERNATIONAL BUSINESS MACHINES CORPORATION;

    申请/专利号US19920893958

  • 发明设计人 FRANZ J. HIMPSEL;

    申请日1992-06-04

  • 分类号B05D5/12;C30B23/00;C30B25/00;

  • 国家 US

  • 入库时间 2022-08-22 04:32:02

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