首页> 外国专利> MANUFACTURE OF SCHOTTKY BARRIER DIODE, AND SCHOTTKY BARRIER DIODE AND SEMICONDUCTOR INTEGRATED CIRCUIT HAVING THE SAME

MANUFACTURE OF SCHOTTKY BARRIER DIODE, AND SCHOTTKY BARRIER DIODE AND SEMICONDUCTOR INTEGRATED CIRCUIT HAVING THE SAME

机译:肖特基势垒二极管的制造以及肖特基势垒二极管和半导体集成电路具有相同的特征

摘要

PURPOSE: To enable a part of semiconductor substrate where an SBD having a shield layer is formed to be made urniform in distribution of impurity concen tration. ;CONSTITUTION: An impurity layer 10, which compensates a semiconductor substrate for its irregularity in distribtution of impurity concentration in a depth direction, is provided adjacent to a point of a shield layer 5 provided below a Schottky junction forming semiconductor region 6 which forms a Schottky barrier diode, wherein the point of the shield layer 5 denotes a point where the layer 5 becomes its peak in impurity concentration.;COPYRIGHT: (C)1995,JPO
机译:用途:为了使形成具有屏蔽层的SBD的半导体衬底的一部分在杂质浓度的分布中呈流形。 ;构成:在形成肖特基的形成半导体区域6的肖特基结的半导体区域6的下方的屏蔽层5的点附近,设置有杂质层10,该杂质层10用于补偿半导体基板的深度方向上的杂质浓度的不均。势垒二极管,其中屏蔽层5的点表示层5达到其杂质浓度峰值的点。;版权所有:(C)1995,JPO

著录项

  • 公开/公告号JPH07263719A

    专利类型

  • 公开/公告日1995-10-13

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19940046276

  • 发明设计人 YATSUDA YUJI;OKADA DAISUKE;GOTO CHIE;

    申请日1994-03-17

  • 分类号H01L29/872;H01L27/10;H01L29/93;

  • 国家 JP

  • 入库时间 2022-08-22 04:29:27

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