首页> 外国专利> Leakage flux flaw detection manner and device

Leakage flux flaw detection manner and device

机译:漏磁通量探伤的方法及装置

摘要

PURPOSE:To detect even minute defects and defects of thin plate materials by putting one surface of a magnetic body for magnetic recording on the surface to be examined of materials to be examined and putting the other surface on a magnetic body layer with a nonmagnetic body layer between them. CONSTITUTION:When one surface of a magnetic layer 111a is put on the surface to be examined of materials to be examined and the other surface is put on a magnetic body layer with a nonmagnetic body layer 1 between them, lift-off from materials 101 to a magnetized tape 111 is 0. In this state, materials 101 are magnetized by a magnetizer 100 and a magnetic flux 7 is allowed to pass the inside of materials 101, and at this time, a leaked magnetic flux 7a from a defect 103 is recorded by the magnetic body layer 111a. The tape 111 is allowed to pass a magnetic head 112 and an induced voltage is generated in the magnetic coil of the head 112 in accordance with the intensity of the magnetic field of the magnetic flux 7a, and a signal 3 of this voltage waveform is obtained and is amplified by an amplifier and is delayed by a means and is stored in a logic storage 6 and is analyzed by a computer 8 thereafter.
机译:目的:通过将用于磁性记录的磁性体的一个表面放在要检查的材料的待测表面上,并将另一表面放在带有非磁性体层的磁性体层上,来检测薄板材料的细微缺陷和缺陷它们之间。组成:当将磁性层111a的一个表面放在要检查的材料的要检查的表面上,而另一表面放在带有非磁性层1的磁性体层上时,从材料101剥离到磁化带111为0。在该状态下,材料101被磁化器100磁化,并使磁通7通过材料101的内部,此时,记录了从缺陷103泄漏的磁通7a。通过磁性体层111a。允许带111通过磁头112,并且根据磁通量7a的磁场强度在磁头112的磁线圈中产生感应电压,并且获得该电压波形的信号3信号被放大器放大并且被装置延迟,被存储在逻辑存储器6中,之后被计算机8分析。

著录项

  • 公开/公告号JPH073407B2

    专利类型

  • 公开/公告日1995-01-18

    原文格式PDF

  • 申请/专利权人 工業技術院長;

    申请/专利号JP19890058478

  • 发明设计人 関根 和喜;野中 勝信;

    申请日1989-03-10

  • 分类号G01N27/85;

  • 国家 JP

  • 入库时间 2022-08-22 04:28:36

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号