首页> 外国专利> NONVOLATILE MEMORY CELL AND ADJUSTING METHOD FOR ITS THRESHOLD VALUE, ADJUSTING METHOD FOR THRESHOLD LEVEL OF PLURAL TRANSISTORS, NONVOLATILE MEMORY AND ITS OPERATIONAL METHOD

NONVOLATILE MEMORY CELL AND ADJUSTING METHOD FOR ITS THRESHOLD VALUE, ADJUSTING METHOD FOR THRESHOLD LEVEL OF PLURAL TRANSISTORS, NONVOLATILE MEMORY AND ITS OPERATIONAL METHOD

机译:非易失性存储器单元及其阈值的调整方法,多晶体管阈值水平的调整方法,非易失性存储器及其操作方法

摘要

PURPOSE:To obtain a nonvolatile semiconductor memory using nonvolatile memory cells in which a threshold level can be easily and accurately adjusted and its operational method. CONSTITUTION:A memory transistor 1 provided with a floating gate is connected to a selecting transistor 8, a memory node N is provided with a capacity element 9 consisting of parasitic capacity or the like. After a drain electrode D of the memory transistor 1 is kept at a high potential, the memory transistor 1 is made a floating state, gate voltage of pulse-like swinging from positive to negative is applied to a gate electrode 2, and a threshold level of the memory transistor having a different level is adjusted to the prescribed level.
机译:目的:获得一种使用非易失性存储单元的非易失性半导体存储器及其操作方法,其中可以容易且准确地调节阈值水平。构成:具有浮置栅极的存储晶体管1连接至选择晶体管8,存储节点N具有由寄生电容等组成的电容元件9。在将存储晶体管1的漏极D保持在高电位之后,使存储晶体管1处于浮置状态,将从正向负摆动的脉冲状的栅极电压施加到栅电极2,并且阈值电平将具有不同电平的存储晶体管的栅极电压调整到规定电平。

著录项

  • 公开/公告号JPH0757490A

    专利类型

  • 公开/公告日1995-03-03

    原文格式PDF

  • 申请/专利权人 NKK CORP;

    申请/专利号JP19940097320

  • 发明设计人 GOTO HIROSHI;

    申请日1994-05-11

  • 分类号G11C16/06;H01L27/115;H01L21/8247;H01L29/788;H01L29/792;

  • 国家 JP

  • 入库时间 2022-08-22 04:22:06

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