首页> 外国专利> ELECTRICAL CHARACTERISTICS TEST OPERABLE IC TRANSFER TRAY AND METHOD FOR ELECTRICAL CHARACTERISTICS TEST USING IC TRANSFER TRAY

ELECTRICAL CHARACTERISTICS TEST OPERABLE IC TRANSFER TRAY AND METHOD FOR ELECTRICAL CHARACTERISTICS TEST USING IC TRANSFER TRAY

机译:电气特性测试可操作的IC传输托盘以及使用IC传输托盘进行电气特性测试的方法

摘要

PURPOSE:To provide an electrical characteristics test operable IC transfer tray even a surface mounted IC while containing in the tray and a method for testing the electrical characteristics. CONSTITUTION:A positioning hole 6 being inserted with an IC positioning pin 5 and an outer lead supporting part 7 for IC are provided at each IC containing part on an IC transfer tray 1 having a plurality of IC containing parts 2. A contact pusher 3 provided with positioning pins 5 are outer lead contact pins 4 is then lowered from above the IC transfer tray 1. The positioning pin 5 is fitted in the positioning hole 6 to position the IC and then the contact pin 4 is brought into contact with an outer lead 10 from above thus effecting the electrical characteristics test for the IC.
机译:目的:提供一种电气特性测试的可操作IC传输托盘,甚至将其安装在表面上的IC托盘中,同时还提供一种测试电气特性的方法。构成:插入有IC定位销5的定位孔6和用于IC的外部引线支撑部分7设置在具有多个IC容纳部分2的IC传送托盘1上的每个IC容纳部分上。设有接触推动器3然后将带有定位销5的外部引线接触销4从IC转移托盘1上方放下。将定位销5插入定位孔6中以定位IC,然后使接触销4与外部引线接触从上面的图10开始,因此实现了IC的电特性测试。

著录项

  • 公开/公告号JPH07140190A

    专利类型

  • 公开/公告日1995-06-02

    原文格式PDF

  • 申请/专利权人 NEC KYUSHU LTD;

    申请/专利号JP19930308684

  • 发明设计人 MIURA TAKEO;

    申请日1993-11-15

  • 分类号G01R31/00;B65D85/00;B65D85/86;G01R1/073;H01L21/66;H01L21/68;

  • 国家 JP

  • 入库时间 2022-08-22 04:22:05

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