首页> 外国专利> SEMICONDUCTOR LAYER COMPRISING CYCLICALLY STACKED NARROW, INTERMEDIATE, AND WIDE BAND GAP SEMICONDUCTOR FILMS

SEMICONDUCTOR LAYER COMPRISING CYCLICALLY STACKED NARROW, INTERMEDIATE, AND WIDE BAND GAP SEMICONDUCTOR FILMS

机译:包含圆形堆叠的窄,中间和宽带隙半导体薄膜的半导体层

摘要

A semiconductor layer which for reflecting anoptical beam comprises a plurality of film pairs of narrowand wide band gap semiconductor films having a refractiveindex difference and narrower and wider band gaps. Anintermediate semiconductor film is interposed between thenarrow and the wide band gap semiconductor films of eachfilm pair and is made to have an intermediate film band gapwhich is varied so as to be equal to the narrower and thewider band gaps at its interfaces contiguous to the narrowand the wide band gap semiconductor films. The narrow bandgap semiconductor film, and a portion adjacent thereto inthe intermediate semiconductor film, are called a firstcomposite layer and are given a first total thickness whichis approximately equal to a quarter of a first wavelengthhad by the optical beam in the first composite layer. Thewide band gap semiconductor film, and a remaining portionadjacent thereto in the intermediate semiconductor film,are called a second composite layer and are given a secondtotal thickness which is approximately equal to a quarterof a second wavelength had by the optical beam in thesecond composite layer. Preferably, the intermediatesemiconductor film should have a film thickness which issubstantially equal to a width which a potential barrierwould have perpendicular to the film pairs if theintermediate semiconductor film were absent. Morepreferably, absorption of the optical beam in the narrowand the wide band gap semiconductor films is taken intoaccount on determining their thicknesses.
机译:半导体层,用于反射光束包括多个窄对薄膜以及具有折射特性的宽带隙半导体膜指数差异和带隙越来越窄。一个中间半导体膜介于每个窄和宽带隙半导体膜膜对,并使其具有中间的膜带隙它变化以等于更窄和界面上较宽的带隙与较窄的带隙相邻和宽带隙半导体膜。窄带间隙半导体膜及其附近的部分中间半导体膜被称为第一复合层并给出第一总厚度大约等于第一波长的四分之一在第一复合层中具有光束。的宽带隙半导体膜,其余部分在中间半导体膜中与其相邻,被称为第二复合层,并被赋予第二层总厚度大约等于四分之一光束在第二复合层。优选地,中间半导体膜的膜厚应为基本上等于势垒的宽度如果垂直于电影对没有中间半导体膜。更多最好是在狭窄的地方吸收光束并把宽带隙半导体膜确定其厚度。

著录项

  • 公开/公告号CA2032869C

    专利类型

  • 公开/公告日1995-10-24

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号CA19902032869

  • 发明设计人 KASAHARA KENICHI;

    申请日1990-12-20

  • 分类号H01S3/043;H01S3/08;

  • 国家 CA

  • 入库时间 2022-08-22 04:16:26

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